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تعداد ۱ پاسخ غیر تکراری از ۱ پاسخ تکراری در مدت زمان ۰,۷۳ ثانیه یافت شد.

1. VLSI design and test :

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Author: S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).

Library: Center and Library of Islamic Studies in European Languages (Qom)

Subject: Integrated circuits-- Very large scale integration-- Design and construction, Congresses.,Integrated circuits-- Very large scale integration-- Testing, Congresses.,Integrated circuits-- Very large scale integration-- Design and construction.,Integrated circuits-- Very large scale integration-- Testing.

Classification :
TK7874
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